95 Results
Creating your own “smart” low-noise amplifier
18-Mar-2019
This application note is a systematic guide to help test engineers configure the Vector Network Analyzer in order to perform compliance test on Automotive Ethernet cables according to the Open Alliance TC9 standard.
13-Aug-2019 | AN-No. GFM323
Their research on S-parameter traceability has put them at the forefront of VNA measurement uncertainty science. With the introduction of the R&S®ZNA K50 measurement uncertainty option, Rohde & Schwarz has partnered with METAS to bring the power of VNA Tools to the R&S®ZNA.
05-Sep-2023
Rohde & Schwarz and Greenerwave collaborate to verify RIS modules and drive 6G researchReconfigurable intelligent surfaces (RIS) can revolutionize wireless communication performance for 5G and future 6G applications. A groundbreaking measurement campaign by Rohde & Schwarz and Greenerwave confirms the capabilities of a novel FR2 RIS module, improving coverage and efficiency.
Rohde & Schwarz oscilloscopes meet frequency response analysis task requirements and provide a cost-optimized alternative to dedicated standalone low frequency network analyzers.
19-Jun-2019
25-Oct-2022
Rohde & Schwarz announces RF Lumination seminar tour to take place in EuropeThe upcoming educational RF Lumination seminar series from Rohde & Schwarz shines a light on typical applications in the RF and microwave industry. In multiple events across Europe, participants can find out more about vector network analysis or learn about applications such as load-pull measurements or power amplifier characterization.
This video demonstrates passive antenna measurements using a Vector Network Analyzer and the AMS32 software This video demonstrates passive antenna measurements using a Vector Network Analyzer and the AMS32 software ATS1000 passive antenna measurements with VNA This video demonstrates passive antenna measurements using a Vector Network Analyzer and the AMS32 software
With continuously increasing data rates, signal integrity in high speed digital designs becomes more and more demanding
08-Jul-2022
Direct remote control of OSP via VNA and SA
06-Dec-2013 | AN-No. 1MA226
Rohde & Schwarz User Manual for the R&S®ZN-Z103 Calibration Unit
Rohde & Schwarz User Manual for the R&S®ZN-Z5x Calibration Unit
Rohde & Schwarz User Manual for the R&S®ZN-Z84 Switch Matrix
Rohde & Schwarz user manual for the R&S ZN-ZE1xx calibration units
Rohde & Schwarz User Manual for the R&S ZN-Z15x Calibration Units
Rohde & Schwarz offers a powerful, wideband test solution covering millimeterwave bands (including the 5G bands) to characterize the integrated amplifiers.
08-Jan-2019
Rohde & Schwarz user manual for the external RFFE/GPIO interface R&S®ZN-Z15
Rohde & Schwarz Getting Started with the R&S®ZNLE Vector Network Analyzer
Rohde & Schwarz Getting Started with the R&S®ZNA Vector Network Analyzer
Rohde & Schwarz User Manual for the R&S ZN-Z154 Calibration Unit.
Rohde & Schwarz Getting Started with the R&S®ZNC/ZND Vector Network Analyzer
I have set my VNA to single sweep mode and switched on averaging with a factor of 10. But when I restart the single sweep, it stops after 1 sweep and the averaging is not done.
Rohde & Schwarz User Manual for the R&S®ZN-Z85 Switch Matrix
Rohde & Schwarz Getting Started with the R&S®ZNB/ZNBT Vector Network Analyzer
Rohde & Schwarz User Manual for the R&S®ZN-Z3x Inline Calibration System
Rohde & Schwarz User Manual for the R&S®Z86/ZN-Z86X Switch Matrix
In combination with the time domain option R&S®ZNA-K2 and the extended time domain option R&S®ZNA-K20, the R&S®ZNA VNA offers a variety of signal integrity measurements.
Thi svideo gives an overview how to calibrate the R&S®ZND, how to perform VNA accuracy measurements, S-parametr and impedance measurements
This application card describes a simplified material characterization method in the automotive radar frequency domain (76 GHz to 81 GHz) with the R&S®QAR50 automotive radome tester.
22-May-2024
This application note describes how to configure a Rohde & Schwarz Network Analyzer to make spectral measurements directly on a device under test.
16-Mar-2012 | AN-No. 1EZ62
19-Jul-2022
Rohde & Schwarz announces on-wafer device characterization test solutionRohde & Schwarz now offers a test solution for full RF performance characterization of the DUT on-wafer which combines the powerful R&S ZNA vector network analyzer from Rohde & Schwarz with industry-leading engineering probe systems from FormFactor. As a result, semiconductor manufacturers can perform reliable and repeatable on-wafer device characterization in the development phase, during product qualification and in production.