8432 Results
RMS is one of the most common parameters in test and measurement. Mathematically, it is the quadratic mean of continuously varying values (waveform). R&S RTM-K32 option provides a digital RMS conversion function for a high-bandwidth RMS measurement.
17-Aug-2015
This application note introduces the working principles of a conventional trigger system and explains the advantages of the real-time capable digital trigger of the RTO oscilloscopes.
11-Apr-2012 | AN-No. 1ER04
Getting Started with NGM Power Supplies_jp Brochures and Data Sheets Miscellaneous
This application note presents the Jitter analysis capabilities of the R&S®RTO for digital signals. It demonstrates the basic operation with an application example, and shows the associated jitter analysis.
29-Aug-2013 | AN-No. 1TD03
This application note describes remote operation or monitoring of the real time spectrum analyzer R&S® FSVR through a standard web browser. The common cross-platform technology Virtual Network Computing (VNC) is used as a server on the instrument.
27-Jul-2010 | AN-No. 1EF74
This application note along with its corresponding white paper 1MA207 show how to use the R&S radar product portfolio to tackle test and measurement tasks in modern radar technology.
10-Aug-2012 | AN-No. 1MA127
This Application Note focuses on measurement of harmonics using modern spectrum analyzers. It highlights the source of harmonics before focusing on their measurement using a spectrum analyzer.
02-Mar-2012 | AN-No. 1EF78
Be ahead in 5G. Turn visions into reality. 5G mmWave test solutions - Flyer
Test solutions for 5G to enable your success - Flyer
This application note describes in detail the steps required to make a noise figure measurement on a spectrum analyzer using the “Y Factor” technique. Background equations are presented for each step of the calculation.
25-Jul-2012 | AN-No. 1MA178
This application note discusses the basics of nonlinearities and describes the nonlinearity measurement using the R&S Value Instruments RF Signal Generator R&S®SMC100A and Spectrum Analyzer R&S®FSC.
20-May-2014 | AN-No. 1MA71
This application note describes a method using the R&S ZVA to measure group delay of mixers and frequency converters with an embedded local oscillator very accurately.
27-Aug-2012 | AN-No. 1EZ60
This Application Note describes the differences in intermodulation distortion measurements between traditional spectrum analyzers with analog narrow-band IF signal path and modern spectrum analyzers using a wide-band IF signal path and digital RBW filters.
02-Jul-2012 | AN-No. 1EF79
This paper describes the Pulsed RF Calculator that suggests spectrum analyzer settings to calculate pulse desensitization.
24-Sep-2015 | AN-No. 1MA240
This application note shows how to configure, calibrate and perform conducted EMS measurements according to IEC / EN 61000-4-6 and EMI measurements according to CISPR 16-2-1 with the R&S®EMC32 software tool.
19-Jul-2013 | AN-No. 1MA212
Loudspeaker measurements with Audio Analyzers UPD or UPL
04-Jun-1998 | AN-No. 1GA16
This application note describes the differences in sweep speed between swept spectrum analyzers and modern spectrum analyzers with a wide-band FFT process, and how this improves the measurement speed for general spurious measurement.
10-Jul-2012 | AN-No. 1EF80
This application note explains the background of blind time and points out why a high acquisition rate is important. It furthermore explains the R&S RTO oscilloscope capabilities and how they help for faster debugging, measurement and analysis.
17-May-2011 | AN-No. 1ER02
Automatic DAB Receiver Test - Test of Re-Synchronisation Capability
11-Nov-2005 | AN-No. FTK04
This application note discusses several basic methods for reading and displaying measurement results from EMI test receivers. The included free programming example is small and easily comprehended, so that users can quickly learn how to program test receivers.
01-Dec-2012 | AN-No. 1MA185
Automatic DAB Receiver Test - Test of Sensitivity
11-Nov-2005 | AN-No. FTK03
This application note describes the techniques to measure the dielectric properties of materials using a vector network analyzer. It also shows methods for converting the s-parameters to dielectric properties.
23-May-2012 | AN-No. RAC-0607-0019
With IT and OT environments converging, security concerns relating to devices and applications deployed in networked test labs, especially in T&M environments, are growing. The demands on IT security here are manifold and include, for example, remote access to in-house infrastructures, equipment rented from external providers, and the continuous deployment of devices across different time zones.
18-Oct-2022
LTE Location Based Services (LBS) involve the process of determining where a device is located.
29-May-2015 | AN-No. 1SP05
This white paper provides an introduction to the technology behind WLAN 802.11ad and highlights the test and measurement requirements.
21-Nov-2013 | AN-No. 1MA220