117 Results
Export complex data of a trace with mathematics and time gating.
VNA - do I really need a sliding match for calibration?
Rohde & Schwarz Getting Started Manual for the R&S®ZNXSIM Vector Network Analyzer PC Simulation
13-Jan-2022
Rohde & Schwarz and FormFactor support the University of Texas at Austin in research on improved RF switches for 5G and 6GThe University of Texas at Austin, Rohde & Schwarz and FormFactor have collaborated to characterize a new technology for RF switches that improves battery life performance and supports higher bandwidths and switching speeds.
Active cal kit or cal unit does not contain all standards needed for selected cal procedure.
Rohde & Schwarz Getting Started for the R&S ZCxxx frequency converters
30-May-2023
Rohde & Schwarz and IEMN collaborate on 6G THz by bringing together electronic and photonic technologiesThe Institute of Electronics, Microelectronics and Nanotechnology (IEMN, Lille, France) and Rohde & Schwarz have expanded their collaboration to research THz communications that utilize photonic technologies. In a recent demonstration, IEMN reached a milestone when researchers achieved generated a 300 GHz bidirectional link over an outdoor distance of 645 m for use in future 6G backhauling scenarios. The R&S SMA100B microwave signal generator from Rohde & Schwarz was a crucial component in the performance test setup. The R&S SMA100B provides an ultra-low phase noise signal that helps accelerate THz communications research and development to ready it for industrialization.
I have several traces with markers in one channel. When I query the result of marker 1 I always get the response of trace 1. How can I get the result of marker 1 for trace 2?
I query the values of a trace using scpi commands. But I get the y-values only. Is there a possibility to get the y-values also (frequency)?
I have a file on my device. How can I get it in a simple way to my PC?
How do I calculate these frequency points when I have a logarithmic sweep and know the center frequency, the span and the number of sweep points?
Rohde & Schwarz Technical Information for the R&S ZN-Z170/-Z135/-Z129/-Z129E calibration kits.
07-Nov-2023
When innovation meets production – Rohde & Schwarz exhibits at productronica 2023Innovation and production – hand in hand. The Rohde & Schwarz motto for this year’s productronica, where the company will present itself as a reliable partner for electronics manufacturing needs. Visit us at booth A1/375.
30-Aug-2023
Rohde & Schwarz showcases its latest mmWave test solutions at the European Microwave Week in BerlinJoin Rohde & Schwarz in Berlin for EuMW 2023, Europe's premier microwave event! Discover cutting-edge test solutions focused on early sub-THz research for 6G.
Early wafer-level qualification of RF components ensures quality and saves money
14-Jul-2022
Maximizing power amplifier efficiency with harmonic load pull measurements
17-Apr-2023
On-wafer characterization at sub-THz frequencies
12-Dec-2023
Instrument health guide for vector network analyzers | Pour les analyseurs de réseaux vectoriels - Flyer Brochures and Data Sheets Flyer
21-Mar-2022
Rohde & Schwarz at DesignCon 2022 presents latest innovations for high-speed digital applicationsAt DesignCon 2022, Rohde & Schwarz will showcase live demos covering industry trends in cooperation with industry experts such as Samtec, ataitec, Clear Signal Solutions, and more.
This paper investigates the evaluation complexities and importantce of PAM-4 interconnects at high data rates.
22-Oct-2020 | AN-No. GFM355
26-Mar-2024
embedded world 2024: Rohde & Schwarz presents its cutting-edge test solutions for embedded systemsRohde & Schwarz offers comprehensive test and measurement solutions for embedded design challenges for today’s requirements for efficiency, safety, reliability and interoperability. The highlights will be showcased at the embedded world Exhibition & Conference 2024 in Nuremberg, Germany.
ZNA, Average Pulse Measurements Making pulsed measurements with a vector network analyzer
23-May-2023
Rohde & Schwarz to host RF Design Challenge at IMS2023At IMS2023, Rohde & Schwarz is set to exhibit a range of live demos that showcase the cutting-edge developments within the industry. IMS attendees will also have the opportunity to participate in the interactive "Are you a genius?" RF Design challenge, putting their knowledge to the test at the Rohde & Schwarz booth.
ZNA, Point-In-Pulse Measurements Making pulsed measurements with a vector network analyzer
The R&S®ZN-Z86 and R&S®ZN-Z86X switch matrices are designed and optimized for use with the R&S®ZNA, R&S®ZNB and R&S®ZNBT vector network analyzers. They offer a comprehensive, cost-effective total solution for simple to complex measurement tasks on multiport or multiple devices.
ZNA, vector network analyzer Making pulsed measurements with a vector network analyzer
This document provides the technical specifications of the R&S®ZCxxx millimeterwave converters.
This application note describes Methods of Implementations (MOI) for precise, fast and error-free compliance testing of high-speed backplanes.
07-Apr-2021 | AN-No. GFM357
This application note describes Methods of Implementations (MOI) for precise, fast and error-free compliance testing of high-speed backplanes and direct attach copper cables (DAC).
07-Apr-2021 | AN-No. GFM356
R&S®ZNx-K100 SNP Assistant - Fact Sheet Brochures and Data Sheets