In high-speed digital measurement applications, test fixtures are commonly used to connect devices under test to measurement equipment. Characterization, and analysis in the time and frequency domains that accounts for various constraints helps to remove the influence of these fixtures.
In high-speed digital measurement applications, test fixtures are commonly used to connect devices under test to measurement equipment. Characterization, and analysis in the time and frequency domains that accounts for various constraints helps to remove the influence of these fixtures.
Touchstone files (*.sxp) for the test fixture, signal trace TX1
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