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Find the information you need from Rohde & Schwarz. Search for products, technologies, applications, manuals, datasheets, tutorials, FAQs, and more.
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The R&S®ZNA high-end vector network analyzers offer a DUT-centric approach, an excellent RF-performance, a unique hardware concept and touch-only operation.
The FFT-based spectrum analysis function can be used to measure a DUT's spurious and harmonics, providing short sweep times along with high dynamic range and fine frequency resolution. It quickly detects undesired signal components (spurious) in converters and T/R modules. The marker-to-spectrumfunction directly gets to the root of problems in the event of unexpected S-parameter results, thus providing fast and extremely useful integrated diagnostics.
Verification kits are used to perform uncertainty evaluations of vector network analyzers. Option R&S®ZNA-K50(P) provides additional uncertainty analysis.
Get the most out of your high-frequency band test and measurement tasks with versatile mmWave converters from Rohde & Schwarz.
A computer simulation for the R&S®ZNA, R&S®ZNB, R&S®ZNBT and R&S®ZND that can be used to test a remote control program without the need for any VNA hardware.
VNA Source Phase Control Options for characterization of devices requiring a defined phase such as differential amplifiers, mixers, IQ mixers and others.
Rohde & Schwarz offers a wide range of versatile vector network analyzers and accessories with excellent characteristics.
Options for characterizing frequency-converting devices such as mixers, block upconverters and downconverters, T/R modules and others.
Calibration accessories for frequency converting measurements, Wide band application
R&S®ZNA高端矢量网络分析仪具备出色的射频特性、独特多方位的硬件架构和以被测设备为中心的操作概念,能够更加轻松地执行高标准测量。
R&S®ZN-Z2xx: high-end manual calibration kits, male and female standards, up to 110 GHz, S-parameter based characterization.
R&S®ZNA-K8 / R&S®ZVA-K8 - software option for clear and straightforward converter control and converter parameter settings.
Millimeterwave mini receiver module for antenna test systems, consisting of a harmonic mixer as downconverter, a booster amplifier for controlled input power and a low noise amplifier for the IF signal.
Millimeterwave receiver modules for antenna test systems with highest dynamic range.
The R&S®ZCxxx millimeterwave converters allow millimeterwave measurements in the frequency range up to 1.1 THz.
R&S®ZVA-Zxxx millimeterwave converters have a wide dynamic range. Rohde & Schwarz converters are very convenient to operate and enable fast measurements.
Learn about the differences between LCR meters and VNAs. Learn how to measure impedance with a network analyzer and how LCR meter impedance measurement works.
Choose Rohde & Schwarz signal and power integrity test solutions for the best application fit thanks to time and frequency considerations.
There are several reasons to characterize RF components under pulsed conditions. Often it is to prevent thermal damage to the device under test or to characterize it under operating conditions. Vector Network Analyzers offer integrated hardware and software for accurate device characterization under pulsed conditions. This hardware includes built-in pulse modulators, pulse generators and synchronization IO including for external device control.
The TDR option displays discontinuities, reflection factors or impedance versus delay/length.
Technical specifications of the R&S®ZNA vector network analyzer. Offering outstanding RF characteristics, a unique and comprehensive hardware architecture and a DUT oriented operation concept, the R&S®ZNA high-end vector network analyzer makes demanding measurements easier than ever before.
Offering outstanding RF characteristics, a unique and comprehensive hardware architecture and a DUT oriented operation concept, the R&S®ZNA high-end vector network analyzer makes demanding measurements easier than ever before.
優れたRF特性、独自の包括的なハードウェアアーキテクチャー、DUT指向の操作コンセプトを備えたR&S®ZNA ハイエンド・ベクトル・ネットワーク・アナライザを使えば、要件の厳しい測定への対応が容易になります。
Noise figure measurement with vector network analyzers
Vector Network Analyzers of t ZNA and ZNB family are able to measure magnitude and phase of complex S-parameters of a device under test (DUT) in the frequency domain.
30-Jul-2020 | AN-No. 1EP83
Models: R&S®ZNA26, R&S®ZNA26, R&S®ZNA43, R&S®ZNA43, R&S®ZNA43, R&S®ZNA43, R&S®ZNA50, R&S®ZNA50, R&S®ZNA67, R&S®ZNA67, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT
Models: R&S®ZNA26, R&S®ZNA26, R&S®ZNA43, R&S®ZNA43, R&S®ZNA43, R&S®ZNA43, R&S®ZNA50, R&S®ZNA50, R&S®ZNA67, R&S®ZNA67, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT
Models: R&S®ZNA26, R&S®ZNA26, R&S®ZNA43, R&S®ZNA43, R&S®ZNA43, R&S®ZNA43, R&S®ZNA50, R&S®ZNA50, R&S®ZNA67, R&S®ZNA67, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT, R&S®ZNA67EXT