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Find the information you need from Rohde & Schwarz. Search for products, technologies, applications, manuals, datasheets, tutorials, FAQs, and more.
Search Rohde-Schwarz.com
Find the information you need from Rohde & Schwarz. Search for products, technologies, applications, manuals, datasheets, tutorials, FAQs, and more.
162 Results
R&S®ZN-Z2xx: high-end manual calibration kits, male and female standards, up to 110 GHz, S-parameter based characterization.
Choose Rohde & Schwarz signal and power integrity test solutions for the best application fit thanks to time and frequency considerations.
In combination with the time domain option R&S®ZNA-K2 and the extended time domain option R&S®ZNA-K20, the R&S®ZNA VNA offers a variety of signal integrity measurements.
Learn about the differences between LCR meters and VNAs. Learn how to measure impedance with a network analyzer and how LCR meter impedance measurement works.
Does the option ZNA-K1 (Spectrum analyzer mode) also work with the Millimeterwave Converters?
Ready for Spectrum Analysis The Rohde & Schwarz Vector Network Analyzer R&S®ZNA features a spectrum analyzer option (R&S®ZNA-K1). The Rohde & Schwarz Vector Network Analyzer R&S®ZNA features a spectrum analyzer option (R&S®ZNA-K1). The spectrum analyzer mode can be used at each of the four ports of the R&S®ZNA.
13-Oct-2020 | Press Release | Test & measurement
Rohde & Schwarz announces awards success with touch-operated analyzerThe R&S ZNA vector network analyzer is named the Test, Measurement & Inspection product of the year at the Electronics Industry Awards.
07-Apr-2021 | Press Release | Test & measurement
Rohde & Schwarz introduces new R&S ZNA vector network analyzers with up to 67 GHz frequency rangeThe R&S ZNA high-end vector network analyzer (VNA) now features models with 50 GHz and 67 GHz maximum frequencies. This opens up the VNA’s outstanding RF performance, unique hardware concept and innovative touch operation to new areas of application. Signal integrity measurements as well as A&D and 5G component and module characterization are main applications for the new analyzer models.
Calibration, METAS, ZNA, ZNB, ZN-Z270, ZN-Z235, ZN-Z229, ZN-Z224, Uncertainty, Traceability, Traceable S-Parameters This video shows the practical steps that an engineer must perform to calibrate the R&S®ZNA, run a verification test and more.
With the introduction of the R&S®ZNA K50 measurement uncertainty option, Rohde & Schwarz has partnered with METAS to bring the power of VNA Tools to the R&S®ZNA. This video is a short summary of how the METAS research can benefit the engineer who makes traceable S-parameter measurements.
The R&S®ZNA vector network analyzer with integrated LO output and direct IF input options is a simple, cost-effective solution for 2-port and 4-port measurements using Rohde & Schwarz mmWave converters.
27-Apr-2023
With high precision, an intuitive user interface and uncertainty bands provided directly on the screen, the R&S®ZNA takes accuracy to a new level.
19-Jul-2021
The R&S®ZNA vector network analyzer offers a dynamic range and unlocks potential applications that previously could not be addressed with a vector network analyzer.
07-Jan-2019
The R&S®ZNA vector network analyzer with integrated LO output and direct IF input options is a simple, cost-effective solution for 2-port and 4-port measurements using Rohde & Schwarz mmWave converters.
19-Jul-2021
13-Jan-2022 | Press Release | Test & measurement
Rohde & Schwarz and FormFactor support the University of Texas at Austin in research on improved RF switches for 5G and 6GThe University of Texas at Austin, Rohde & Schwarz and FormFactor have collaborated to characterize a new technology for RF switches that improves battery life performance and supports higher bandwidths and switching speeds.
This application note describes a method using the R&S®ZNA analyzer family to measure group delay of mixers and frequency converters with an embedded local oscillator very accurately.
11-Jul-2019 | AN-No. 1EZ81
RF system noise contributions define receiver capabilities and sensitivity. The noise figure measures how the critical components affect the signal.
28-Jan-2022
Load pull is a powerful method to characterize RF power amplifiers and enablse model extraction and validation and performance, ruggedness and efficiency testing.
02-Sep-2020
Nonlinear applications using Rohde & Schwarz vector network analyzers - Product Flyer
Noise figure is an important parameter that describes the noise contribution of an electronic device. A classical approach to measure the noise figure is to use a noise source which delivers two different input noise powers by switching between a “hot” and a “cold” state and a noise receiver
23-Dec-2021 | AN-No. 1SL378
This application note shows how to measure the phase accurately between several signals using vector network analyzers of the R&S®ZNA, R&S®ZNB and R&S®ZNBT families.
11-Jul-2019 | AN-No. 1EZ82
With continuously increasing data rates, signal integrity in high speed digital designs becomes more and more demanding
08-Jul-2022
Here you will find bargains like the latest generation test and measurement instruments which have been used by our sales teams for demonstration, training and loan.
This application note provides practical hints to accurately characterize and de-embed these lead-in and lead-out structures with R&S Vector Network Analyzers ZNA, ZNB, ZNBT and ZND.
19-Sep-2022 | AN-No. 1SL367
Rohde & Schwarz User Manual for the R&S®ZNA Vector Network Analyzer
Choose Rohde & Schwarz test solutions for mixers & frequency converters for dynamic range, ease of operation and phase noise performance reasons.
The user is requested to move results from a Network Analyzer to the controller PC or to a network drive.
Choose Rohde & Schwarz test solutions for power amplifier efficiency optimization for their dual path signal generation capabilities and ease of results analysis.
Learn about different aspects of load pull analysis and testing. Discover a load pull measurement setup from an industry leader in load pull testing. Explore now.
Discover solutions for on-wafer testing, die testing and RF probing. Explore wafer testing equipment, such as vector network analyzers and probe stations.