174 Results
The demand having a snubber circuit in the power supply topology leads to specific verification methods during the design which are the main focus within this document.
23-Jun-2021 | AN-No. 1SL363
This document provides: - An explanation of update rate - How users can quickly perform their own update rate characterization - How to compare vendor update rates - Benefits of fast update rate
This document provides: - An explanation of analog versus digital triggering architectures - User advantages for oscilloscopes that have digital triggering - How to determine if an oscilloscope has a digital or analog trigger
本白皮书包含以下内容:- 模拟和数字触发架构 - 数字触发示波器的优势 - 如何辨别数字或模拟触发示波器
Measure and analyze signals with the R&S®FSW Signal and Spectrum Analyzer platform in collaboration with an R&S®RTO Digital Oscilloscope.
16-Jun-2015 | AN-No. 1EF92
Oscilloscope innovation. Measurement confidence. - Flyer Brochures and Data Sheets Flyer
01-Mar-2023
Embedded world 2023: Rohde & Schwarz showcases its state-of-the-art test solutions for embedded systemsEmbedded systems are at the core of today’s electronic devices, whether in consumer electronics, telecommunications, industrial, medical, automotive or aerospace applications. Flawless operation is crucial, and engineers face complex challenges when designing ever more compact embedded systems which meet today’s demands of efficiency, safety, reliability and interoperability. Rohde & Schwarz addresses these challenges with its wide-ranging test and measurement solutions showcased at the embedded world Exhibition & Conference 2023 in Nuremberg.
Secondary surveillance radar (SSR) bridges the gap between communications systems and classic radar systems. Despite the increasing capabilities of mobile communications, SSR remains a major component in airspace surveillance.
17-May-2021
For system verification and debugging, eye diagram measurements are the most important tools for efficiently analyzing the signal integrity in any digital design
19-Feb-2019
The R&S®RTP and R&S®RTO2000 oscilloscopes are capable of characterizing high speed datacom interfaces and performing in-depth signal integrity analysis.
31-Mar-2021
Importance of deep memory in digital oscilloscopes - Rohde & Schwarz oscilloscopes offer industry-leading memory depth.
21-Mar-2017
Models: R&S®RTO-K92, R&S®RTO6-K92
Models: R&S®RTO-K87, R&S®RTP-K87, R&S®RTO6-K87
Models: R&S®RTP-K89, R&S®RTO-K89, R&S®RTO6-K89
Models: R&S®RTO-K24, R&S®RTP-K24, R&S®RTO6-K24
Models: R&S®RTO-K26, R&S®RTO-K27, R&S®RTO6-K27, R&S®RTP-K27
Models: R&S®RTP-K25, R&S®RTO-K25, R&S®RTO6-K23
Models: R&S®RTO-K86, R&S®RTP-K86, R&S®RTO6-K22
This application note focusses on signal measurement using the R&S®RTO digital oscilloscopes ant the output of I/Q data for processing.
18-Oct-2016 | AN-No. 1MA249
Models: R&S®RTO-K21, R&S®RTO6-K21, R&S®RTP-K21, R&S®RTP-K102
Models: R&S®RTP-K81, R&S®RTO-K81, R&S®RTO6-K81, R&S®RTP-K83
Models: R&S®RTP-K91, R&S®RTO-K91, R&S®RTO6-K91, R&S®RTP-K93, R&S®RTP-K94
Testing LTE MIMO Signals using a R&S RTO Oscilloscope
24-Apr-2013 | AN-No. 1EF86
This application note describes two test solutions from R&S® to cope with the 5G FR1 downlink MIMO signal analysis challenges either using R&S®RTP/RTO oscilloscope or R&S®NRQ6 frequency selective power sensor.
26-Jun-2020 | AN-No. GFM343
With the RTO-K17/RTE-K17 High Definition Option the user will see more signal details with up to 16 bit vertical resolution.
13-Apr-2015 | AN-No. 1TD06
This guide covers the most important aspects of selecting an oscilloscope and provides you with the knowledge to make the best choice for your needs.
This document provides: - A description of how oscilloscope acquisition memory is defined - Insight into the relationship between memory and other oscilloscope parameters - Examples where deep memory provides value
本指南将介绍以下内容:- 示波器采集存储的定义 - 存储和其他示波器参数的关系 - 深存储的作用示例
This application note explains how to measure the oscilloscope ENOB and shows results for the R&S®RTO for different settings.
13-May-2011 | AN-No. 1ER03
This application note describes Battery Life Measurements with the R&S®RT-ZVC02/04 Multi-Channel Probe. The measurements are described with the use of an oscilloscope.
17-Jan-2019 | AN-No. 1TD07