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This application note describes the techniques to measure the dielectric properties of materials using a vector network analyzer. It also shows methods for converting the s-parameters to dielectric properties.
23-May-2012 | AN-No. RAC-0607-0019
This application note describes the tests performed with additional equipment and presents straightforward solutions based on the R&S®CBTgo software.
18-Jul-2013 | AN-No. 1MA200