RF Testing Innovations Forum

RF Testing Innovations Forum

May 20 - 21, 2025

Date
Date
20-May-2025 - 21-May-2025
Country
Location

Online

Info
Info

Language: English
Free of charge

Virtual event

Elevate Your RF Expertise

Latest innovations & trends - High quality conferences - Industry experts

Join us for the RF Testing Innovations Forum 2025, taking place on May 20-21, 2025, where RF design engineers will gain invaluable insights into the latest advancements in testing methodologies and technologies.

This two-day online event, led by experts from Rohde & Schwarz and industry partners, will explore critical topics shaping the future of RF testing. Attendees will delve into the evolution of Vector Network Analyzers (VNAs), enhancing the accuracy of mm-wave non-linear vector analyzers, and addressing the challenges of on-wafer characterization for BAW filter harmonics.

Participants will also discover innovative approaches to wideband modulated load pull and learn how to accelerate antenna pattern analysis and simulation using MATLAB. The forum will highlight the importance of stable and highly accurate test levels through closed-loop power control, while rethinking beamforming strategies for more efficient implementations. Additionally, advanced measurement techniques for ultra-wideband software-defined radios will be discussed, equipping engineers with the knowledge to tackle emerging challenges in RF design and testing.

Don’t miss this opportunity to enhance your expertise and network with industry leaders at the forefront of RF innovation.

Register now!

Agenda

Discover online conferences below.

To learn more about abstracts, we invite you to download the detailed agenda.


Session 1, Tuesday May 20, 2025

Session 2, Wednesday, May 21, 2025
9:00 Opening 9:00 Opening
9:05 Keynote
Michael Fischlein from Rohde & Schwarz
9:05 Keynote: Evolution in VNAs – Interview with Dr. Benoît Derat, Senior Director VNA R&D
Markus Lörner and Benoît Derat from Rohde & Schwarz
9:20 Improving the accuracy of a mm-wave non-linear vector analyzer
Roberto Quaglia from University of Cardiff
9:20 Challenges of on-wafer characterization of BAW filter harmonics
Susanne Kreuzer from Qorvo
10:00 Wideband modulated load pull
Luca Gragnaniello from Rohde & Schwarz
10:00 Accelerating Antenna Pattern Analysis and Simulation with MATLAB
Giorgia Zucchelli from Mathworks
10:40 Stable and highly accurate test levels thanks to closed loop power control
Frank Thümmler from Rohde & Schwarz
10:40 Dataset Acquisition Optimization for AI-controlled electronically steerable antennas
Dr. Sana Abadi from Greenerwave
11:20 BREAK 11:20 BREAK
11:40 Exploring Load Pull Techniques for Next-Generation 6G Sub-THz Components
Giampiero Esposito from Maury Microwave, Inc.
11:40 Advanced Measurement Techniques for Ultra-
Wideband Software Defined Radios

Jon Hall and Kate Berry from Analog Devices
12:20 Characterizing Wideband Active RF Components using real-world Stimulus signals
Florian Ramian from Rohde & Schwarz
12:20 Fast Forward in RFFE production – the R&S®ZNB3000 Vector Network Analyzer
Yassen Mikhailov and Wojciech Kuropatwinski-Kaiser from Rohde & Schwarz
13:00 Closing - Day 1 13:00 Closing - Day 2

Rohde & Schwarz presenters

  • 1Michael Fischlein
  • 2Luca Gragnaniello
  • 3Frank-Werner Thümmler
  • 4Dr. Benoît Derat
Portrait image of Michael Fischlein

Michael Fischlein, Vice President Spectrum and Network Analyzer, EMC & Antenna Test at Rohde & Schwarz

Michael Fischlein is Vice President Spectrum & Network Analyzers, EMC and Antenna Test Equipment at Rohde & Schwarz. Previously, he served as Senior Director Network and Economy Analyzers, leading the research and development team. From 2000 until 2018 he held various positions in test and measurement at Rohde & Schwarz, initially in analog design of RF frontends, followed by a role as project leader for several economy products.

  • 1Florian Ramian
  • 2Yassen Mikhailov
  • 3Wojciech Kuropatwinski-Kaiser
Portrait image of Florian Ramian

Florian Ramian, DSP Development at Rohde & Schwarz

Florian Ramian is a Development Engineer at Rohde&Schwarz, primarily focusing on the analysis of non-linear DUTs. Florian has 20 years of experience as an RF engineer including R&D for automotive radars as well as 15+ years of test and measurement experience. Before moving into R&D he held several positions as an Application Engineer for R&S Spectrum & Signal-Analyzers and Researcher at TU München. He received his Dr.-Ing. and Dipl.-Ing. degrees both from Technische Universität München.

Partners presenters

  • 1Roberto Quaglia
  • 2Giampiero Esposito
  • 3Susanne Kreuzer
  • 4Giorgia Zucchelli
Portrait image of Roberto Quaglia

Roberto Quaglia, Senior Lecturer and Group Leader of the Centre for High Frequency Engineering at University of Cardiff

Roberto Quaglia received his PhD from Politecnico di Torino, Torino, Italy. After a short spell in Industry, he joined Cardiff University, UK, in 2015 with a European Fellowship. He is now a Senior Lecturer and the Group Leader of the Centre for High Frequency Engineering. His research focusses on design, characterisation and modelling for microwave and mm-wave power amplifiers.

  • 1Dr. Sana Abid
  • 2Kate Berry
  • 3Jon Hall
Portrait image of Sana Abid

Dr. Sana Abid, R&D Engineer at Greenerwave

Sana Abid is an emerging Lab Coordinator and R&D Engineer at Greenerwave in Paris, with a background in microwave imaging, signal processing, and electromagnetic instrumentation.

Currently working as responsible for the management of radio frequency laboratory activities, ensuring efficient experimental operations, coordination of technical and scientific teams. Her position is crucial in supporting innovation and contributing to high-tech research projects.

Previously, she contributed to the development of microwave radar imaging methods for automotive applications.

Sana holds a PhD in Electronics and computer science from the XLIM Research Institute (University of Limoges, France), where her research focused on computational interferometric imaging using a chaotic cavity as an analog coding device. This work aimed to reduce the cost and complexity of imaging systems, with experimental validations conducted in the millimeter-wave band.