Search Application Notes & Cards
Learn how to configure Rohde & Schwarz products to fit your application. Search our database by product, technology, or application to find relevant technical documents.
Search Application Notes & Cards
Learn how to configure Rohde & Schwarz products to fit your application. Search our database by product, technology, or application to find relevant technical documents.
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The CMD 57/59 output level for BER measurement can be calibrated to high accuracy to match GSM 11.21, (with modulated signals and adjacent timeslots + 50 dB above the used timeslot) using a simple test setup containing an NRVD power meter and an FSE spectrum analyzer.
10-Mar-2000 | AN-No. 1MA24
The application note describes the Measurement Uncertainty Analysis Program NRV-Z. The program is used to determine measurement uncertainties that inevitably arise when using power meters. In particular, it covers the NRV-Z family of thermal sensors and diode sensors for high-precision power measurements, as well as the compatible basic units NRVD, NRVS and URV55.
26-Jul-2001 | AN-No. 1GP43
The purpose of the test setup described is to ensure or to enhance the level accuracy of signal generators or the generator part of communication testers. The level accuracy of test signals is particularly important at low levels when measuring BER level sensitivity at digital communication receivers. The highly linear FSP spectrum analyzer is used in combination with a power meter to get the best possible accuracy with high measurement speed over a very wide level range.
18-Feb-2011 | AN-No. 1MA21
This application note describes how to generate 3GPP (UTRA-FDD) signals for receiver tests under fading conditions for user equipment. The test setup requires an R&S®CMU200 Universal Radio Communication Tester with option R&S®CMU-B17 IQ-IF interface and an R&S®SMIQ Vector Signal Generator. The test setup can be calibrated with either a R&S®NRP-Zx USB power sensor or an NRP, NRVD, or NRVS Power Meter. To calibrate the baseband and RF path and configure performance tests according to the 3GPP test specification 34.121 easily, the program 3GFadLevCor is included.
01-Mar-2005 | AN-No. 1MA76
The use of Rohde & Schwarz device drivers under VEE software is not complicated. However, a number of factors are involved, the errors that occur are often difficult to diagnose. This application provides easy and detailed support for installation and troubleshooting using National Instruments or Agilent GPIB boards.
20-Dec-2012 | AN-No. 1MA035