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Find the information you need from Rohde & Schwarz. Search for products, technologies, applications, manuals, datasheets, tutorials, FAQs, and more.
Search Rohde-Schwarz.com
Find the information you need from Rohde & Schwarz. Search for products, technologies, applications, manuals, datasheets, tutorials, FAQs, and more.
175 Results
High-end manual calibration kits, male and female standards, up to 18 GHz, 33 GHz, S-parameter based characterization.
The R&S campus dashboard software simplifies teaching of student groups in laboratories with multiple workbenches. Learn more about the CDS scope software.
ZN-Z3x: Automatic recalibration without reconnecting calibration equipment. Supports TVAC, multiport and production systems. CAN bus network control. Up to 40 GHz.
Network analyzer waveguide calibration kits, up to 1100 GHz, models with sliding match.
Explore material characterization techniques and applications. Discover impedance analyzers and other material characterization equipment from an industry leader.
Learn about the differences between LCR meters and VNAs. Learn how to measure impedance with a network analyzer and how LCR meter impedance measurement works.
Series of automatic economy calibration units with frequencies up to 50 GHz. 2 and 4 port models available. ZN-Z51 has configurable test ports.
This primer describes the fundamentals of vector network analysis, as well as practical instructions for improving accuracy, performing calibration, and making typical linear and time-domain measurements.
The user is requested to move results from a Network Analyzer to the controller PC or to a network drive.
Bode plots are useful when analyzing magnitude and phase changes introduced by a LTI system. Learn more about Bode plots and oscilloscopes here.
Rohde & Schwarz is partnering with other well known companies in the industry to provide customers with the best possible solutions.
Rohde & Schwarz Getting Started with the R&S®ZNL Vector Network Analyzer
Rohde & Schwarz User Manual for the R&S®ZNA Vector Network Analyzer
Rohde & Schwarz User Manual for the R&S®ZNC/ZND Vector Network Analyzer
Rohde & Schwarz User Manual for the R&S®ZNB/ZNBT Vector Network Analyzer
Overview of Rohde & Schwarz TRM and antenna testing. Explanation of all application fields.
Rohde & Schwarz User Manual for the R&S®ZNL/ZNLE Vector Network Analyzer
Explore solutions for satellite payload testing for every stage of the satellite lifecycle, including development, verification, TVAC validation and more.
Welcome to Rohde & Schwarz webinar VNA: Signal Integrity and Deembedding
Welcome to the Rohde & Schwarz webinar VNA: IQ Mixer Characterization.
Welcome to Rohde & Schwarz webinar VNA: Noise Figure Measurements.
Explore an engineer’s toolbox with our comprehensive list of electronic test equipment. Learn about the instruments that define modern electronics testing.
This webinar contains the basic and novel methods for the characterization of mixers with VNAs.
This webinar shows the basic and novel methods for the characterization of mixers with VNAs.
Register for this webinar and learn more about advanced deembedding with solutions from Rohde & Schwarz.
Discover Rohde & Schwarz solutions for automotive Ethernet testing: world's first compliance test solution for 1000BASE-T1.
A wide range of Signal Integrity solutions from Rohde & Schwarz ► Get more information!
Welcome to our webinar Introduction to Vector Network Analysis
Welcome to Rohde & Schwarz webinar VNA: Pulse Measurements and Analysis.
07-Jun-2023 | Press Release | Test & measurement
Rohde & Schwarz presents first automated solution to speed up PCIe 5.0 and 6.0 cable and connector compliance testingFor precise and time-saving compliance testing of the latest generation PCIe 5.0 and 6.0 cables and connectors in line with PCI-SIG specification, Rohde & Schwarz presents a new R&S ZNrun test automation option. The solution reduces testing times for PCIe x8 cables to just a few minutes for complete test runs. By comparison, manual testing takes several hours and involves major risk of connection errors by test engineers.