156 Results
Changing the update display rate of a sweep with many sweep points.
R&S ZCWM-570 Technical Information
12-Oct-2022
Rohde & Schwarz empowers launch of 4D imaging radar platform by automotive radar manufacturer Cubtek in partnership with NXPCubtek Inc. is using network analyzers from Rohde & Schwarz in the development of 4D imaging radar for RF measurement of the E-band. Rohde & Schwarz oscilloscopes and their independently developed, application-specific integrated circuits (ASIC) provide the best measurement tools for automotive radar research and development.
Calibrating a vector network analyzer (VNA) with different connectors on each port
Converting the real and imaginary numbers to magnitude in dB and phase in degrees.
R&S®ZVAX-TRM User Manual
R&S®ZVAX-TRM Instrument Security Manual
What is the correct pin layout of the DC inputs on the network analyzer's rear panel?
Sending a remote Control Command internally
R&S ZCxxx Converter Power Supply User Manual
R&S®ZVAX24 Quick Start Guide
I have set my VNA to single sweep mode and switched on averaging with a factor of 10. But when I restart the single sweep, it stops after 1 sweep and the averaging is not done.
Rohde & Schwarz Getting Started for the R&S ZCxxx frequency converters
05-Sep-2023
Rohde & Schwarz and Greenerwave collaborate to verify RIS modules and drive 6G researchReconfigurable intelligent surfaces (RIS) can revolutionize wireless communication performance for 5G and future 6G applications. A groundbreaking measurement campaign by Rohde & Schwarz and Greenerwave confirms the capabilities of a novel FR2 RIS module, improving coverage and efficiency.
I query the values of a trace using scpi commands. But I get the y-values only. Is there a possibility to get the y-values also (frequency)?
I trigger this single sweep with the RSZVB_Send_Trigger_and_Wait_for_OPC driver, but this driver does not wait for the complete 10 sweeps. If I don't use averaging, this program is works.
How can I switch from remote to local state via remote control?
TDR, TDT, ZVA vector network analyzer This video series demonstrates the calibration of a four-port network analyzer and the measurement of rise time, impedance vs. distance and skew on a board with differential lines
How do I calculate these frequency points when I have a logarithmic sweep and know the center frequency, the span and the number of sweep points?
I have used my TRL calibration kit with my ZVA before. Now I want to use also with my ZNB. But when I try to load the data of the calibration kit into the ZNB, the above error message is shown.
R&S ZV-WR02/WR03/-WR05 Technical Information
TDR, TDT, ZVA vector network analyzer, This video series demonstrates the calibration of a four-port network analyzer and the measurement of rise time, impedance vs. distance and skew on a board with differential lines.
TDR, TDT, ZVA vector network analyzer, This video series demonstrates the calibration of a four-port network analyzer and the measurement of rise time, impedance vs. distance and skew on a board with differential lines.
TDR, TDT, ZVA vector network analyzer This video series demonstrates the calibration of a four-port network analyzer and the measurement of rise time, impedance vs. distance and skew on a board with differential lines.
The R&S®ZVA vector network analyzer in combination with the R&S®ZVAB-K30 noise figure measurement option simplifies noise figure measurement, a key parameter for receiver performance evaluation.
This application note describes how to configure a Rohde & Schwarz Network Analyzer to make spectral measurements directly on a device under test.
16-Mar-2012 | AN-No. 1EZ62
R&S ZV-WR06/-WR08/-WR10/-WR12/-WR15 Technical Information
Rohde & Schwarz Technical Information for the R&S ZV-Z129/-Z135/-Z170 calibration kits.
ZVA Vector Network Analyzers, PIM, Rohde & Schwarz demonstrated fast and accurate passive intermodulation (PIM) testing of duplex filters at the European Microwave Week 2013 in Nuremberg.
This application note describes the techniques to measure the dielectric properties of materials using a vector network analyzer. It also shows methods for converting the s-parameters to dielectric properties.
23-May-2012 | AN-No. RAC-0607-0019