R&S®Cloud4Testing: Transient analysis application package

Cloud based testing solution for frequency agile radar systems

R&S®Cloud4Testing: Transient analysis application package
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R&S®Cloud4Testing: transient analysis application package, screenshot

Key facts

  • Ideal for transient measurements
  • Includes analysis of hopping sequences
  • Measure chirps or FMCW signals
  • Use our flexible subscription models

Transient analysis challenges call for lean solutions

Cloud-based software for characterization of frequency-agile signals

R&S®Cloud4Testing provides quick and easy access to Rohde & Schwarz transient analysis testing essentials without any major investment. Simply measure, analyze and process your individual RF data, on demand and on the go.

This transient analysis application package for R&S®Cloud4Testing can access to the R&S®VSE-K60 transient analysis option, ideal for radar system manufacturers and developers who need to characterize frequency-agile signals, including analysis of hopping sequences (R&S®VSE-K60H) and chirps or FMCW signals (R&S®VSE-K60C).;

Features & benefits

Chirp analysis

The R&S®VSE-K60C option displays the frequency response and calculates the deviation from the ideal linear phase, even for the non-pulsed FMCW radar signals commonly used in automotive radars.
Measurement parameters:
frequency deviation, chirp begin, chirp length, chirp rate, chirp state deviation, phase deviation, power, power ripple

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Frequency hopping signals

The R&S®VSE-K60H automatically analyzes the hopping sequence of fast frequency hopping pulsed signals used in automotive and aerospace and defense applications.
Measurements parameters:
dwell time, settling time, switching time, frequency deviation, power, phase deviation, power ripple

In-depth analysis

Spectrogram and section of spectrogram, tabular display, frequency, frequency error, phase and amplitude versus time, FFT spectrum
Pan and zoom functions to select analysis region with touch gestures in spectrogram, spectrum and time domain trace displays
Trends and histograms for all parameters
Hop/chirp statistics: standard deviation, average, maximum, minimum
User-defined measurement parameters

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