3 Results
Early wafer-level qualification of RF components ensures quality and saves money
14-Jul-2022
On-wafer characterization at sub-THz frequencies
12-Dec-2023
This application note describes a technique to perform the noise figure measurement with FSW-K30 on lossy devices like attenuators with high loss in front of the low noise amplifiers.
24-Jun-2020 | AN-No. 1EF110