8206 Results
This application note explains how to detect, characterize, find and document interferers in cellular networks using the R&S®FSH spectrum analyzer.
21-Oct-2014 | AN-No. 1EF89
This application note describes how to integrate R&S®ZVA/ZVB/ZVT vector network analyzers with AWR's electronic design automation (EDA) software. Measured data can be exported using the AWR® TestWave™ tool via GPIB/LAN and verified with simulated data.
01-Jun-2010 | AN-No. 1MA163
This application note describes how to generate and analyze wideband digitally modulated signals in the mm-wave range. Rohde & Schwarz measuring equipment and some 3rd party off-the-shelf accessories are used for both signal generation and analysis.
02-Sep-2014 | AN-No. 1MA217
This application note describes the techniques to measure the dielectric properties of materials using a vector network analyzer. It also shows methods for converting the s-parameters to dielectric properties.
23-May-2012 | AN-No. RAC-0607-0019
LTE-Advanced Technology Introduction
20-Aug-2012 | AN-No. 1MA169
RMS is one of the most common parameters in test and measurement. Mathematically, it is the quadratic mean of continuously varying values (waveform). R&S RTM-K32 option provides a digital RMS conversion function for a high-bandwidth RMS measurement.
17-Aug-2015
This application note describes how to use the LTE Frequency Division Duplex (FDD) and Time Division Duplex (TDD) measurement functionality provided by the R&S®CMW500 wideband radio communication tester to perform LTE transmitter and receiver measurements.
17-May-2013 | AN-No. 1CM94
Operating manuals commonly focus on explaining a dedicated feature of a single instrument. This application note examines a range of typical user tasks and how to solve them with the different instruments.
26-Apr-2013 | AN-No. 1GP72
This application note describes the differences in sweep speed between swept spectrum analyzers and modern spectrum analyzers with a wide-band FFT process, and how this improves the measurement speed for general spurious measurement.
10-Jul-2012 | AN-No. 1EF80
LTE Transmission Modes and Beamforming
10-Jul-2015 | AN-No. 1MA186
UMTS Long Term Evolution (LTE) Technology Introduction
14-Sep-2009 | AN-No. 1MA111
This application note discusses the basics of nonlinearities and describes the nonlinearity measurement using the R&S Value Instruments RF Signal Generator R&S®SMC100A and Spectrum Analyzer R&S®FSC.
20-May-2014 | AN-No. 1MA71
Save up to 49% on the most popular T&M instrument configurations
Oscilloscopes for education special edition Canada flyer
Today's Solutions for Tomorrow's Challenge
Save up to 49% on the most popular configurations of T&M instrument configurations from Rohde&Schwarz. This promotional offer includes all essential instruments found on an engineer’s workbench: oscilloscopes, DC power supplies, spectrum and antenna analyzers, signal generators, LCR meters and source measure units (SMU).
Trade-In Promotion. Up to 30% trade in credit for Spectrum and Signal Analyzers.
Save up to 49% on the most popular T&M instrument configurations
Save up to 49% on the most popular T&M instrument configurations
Terms & Conditions of Purchase Version: November 2023