6 Results
Early wafer-level qualification of RF components ensures quality and saves money
14-Jul-2022
On-wafer characterization at sub-THz frequencies
12-Dec-2023
19-Jul-2022
Rohde & Schwarz announces on-wafer device characterization test solutionRohde & Schwarz now offers a test solution for full RF performance characterization of the DUT on-wafer which combines the powerful R&S ZNA vector network analyzer from Rohde & Schwarz with industry-leading engineering probe systems from FormFactor. As a result, semiconductor manufacturers can perform reliable and repeatable on-wafer device characterization in the development phase, during product qualification and in production.
This application note describes a technique to perform the noise figure measurement with FSW-K30 on lossy devices like attenuators with high loss in front of the low noise amplifiers.
24-Jun-2020 | AN-No. 1EF110
07-Apr-2021
Rohde & Schwarz introduces new R&S ZNA vector network analyzers with up to 67 GHz frequency rangeThe R&S ZNA high-end vector network analyzer (VNA) now features models with 50 GHz and 67 GHz maximum frequencies. This opens up the VNA’s outstanding RF performance, unique hardware concept and innovative touch operation to new areas of application. Signal integrity measurements as well as A&D and 5G component and module characterization are main applications for the new analyzer models.
07-Jan-2021
EuMW virtual: Rohde & Schwarz demonstrates reliable microwave test solutions for future-looking applicationsRohde & Schwarz is participating at EuMW virtual with a lavishly designed virtual trade show booth, where visitors can learn about new developments and exchange ideas with experts. The focus is on test systems for RF frontend designs, for radar and satellite systems and for wireless technologies from 5G to the sub-terahertz range. European Microwave Week 2020 was postponed and takes place from January 10 to 15, 2021, as an online event.