PVT360A Explainer video

Rohde & Schwarz came up with a new test concept for holistic base station testing, as well as RF component testing

The ever-increasing development pace and number of components to be tested also set high requirements for testing. To allow an efficient production, test instruments need to be space-saving, cost-efficient and, above else, fast.

Rohde & Schwarz came up with a new test concept for holistic base station testing, as well as RF component testing: The new PVT360A performance vector tester combines signal generation and signal analysis in one box, is scalable up to two vector signal generators and two vector signal analyzers, and offers two times eight RF ports in a small form factor.

For optimal resource utilization, the PVT360A provides different methods for parallelized tests and covers a frequency range from 400 MHz to 8 GHz and a maximum bandwidth of 500 MHz, offering the flexibility required for the applications of today, and tomorrow.

This reliable hardware and software package makes the PVT360A perfectly suited for production lines.

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PVT360A combined vector signal generator and analyzer

New instrument for base station, small cell and RF component test in production and characterization envirnments: The PVT360A comes with two independent signal generators and analyzers for fast parallelized measurements. A frequency range of up to 8 GHz, flexible bandwidth configuration and an optional second TRX channel provide the necessary performance and enable flexible adaptation in a small form factor.

RF testing systems

Efficient small cell test with the PVT360A

The R&S®PVT360A provides measurement capabilities to test the physical layer of base stations and small cells. With frequencies up to 8 GHz and an optional bandwidth configuration of up to 500 MHz, all FR1 frequency bands are covered by the R&S PVT360A. Standard-compliant signal generation and analysis for 5G NR provide comprehensive test capabilities. Parallel measurements on the two independent signal generators and analyzers as well as fast sequential measurements using the switch matrix provide high measurement speed.

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