16 Results
In-depth analysis of an eye diagram of the high-performance CPU PCIe Gen 3 interface. In-depth analysis of an eye diagram of the high-performance CPU PCIe Gen 3 interface. eye diagram,high-performance CPU PCIe Gen 3 interface In-depth analysis of an eye diagram of the high-performance CPU PCIe Gen 3 interface.
For system verification and debugging, eye diagram measurements are the most important tools for efficiently analyzing the signal integrity in any digital design
19-Feb-2019
Verifying the Impact with Eye Diagram The Eye Diagram is an effective tool to validate signal integrity. This video compares the eye diagram on a signal acquired at the output of a USB transmitter versus a waveform with some added cable emulation. The Eye Diagram is an effective tool to validate signal integrity.
How to set up eye diagram measurements with option R&S®ZNB-K20 The R&S®ZNB-K20 option enables to display eye diagrams on the R&S®ZNB and R&S®ZNBT vector network analyzers from Rohde & Schwarz. Eye diagram measurements and eye mask testing with the R&S®ZNB-K20 extended time domain option.
Simplified eye diagram analysis with option R&S®ZNB-K20. The R&S®ZNB and R&S®ZNBT vector network analyzers from Rohde & Schwarz now support eye diagrams. The R&S®ZNB and R&S®ZNBT vector network analyzers from Rohde & Schwarz now support eye diagrams. Eye diagrams are used to determine the quality of a signal transmitting device.
The digital trigger of the R&S®RTP combined with the zone trigger offers versatile and flexible triggering capabilities for DDR memory interface measurements.
26-Sep-2018
Live Eye Diagram Learn about key advantages of the PAM-N analysis option on the R&S RTP & RTO6 oscilloscopes. In combination with the CDR option, obtain the fastest eye diagrams to characterize signal behaviour in seconds. The Advanced Eye Analysis option enables on the R&S RTP oscilloscope utilizes a hardware-based Clock-Data-Recovery trigger (CDR).
Live Eye Diagram Learn about key advantages of the PAM-N analysis option on the R&S RTP & RTO6 oscilloscopes. In combination with the CDR option, obtain the fastest eye diagrams to characterize signal behaviour in seconds. Characterize and verify the signal quality of a PAM signal with the Advanced Eye diagram and the PAM-N Analysis option.
What is an eye diagram and why is Jitter that important? Which influence do filters and interconnects have on SI, PI and EMI? Webinar, Würth, Power integrity, Practical Boost converter Watch this video and learn more about characterizing the AC on DC power rails, eye diagrams, Jitter and the influence of filters and interconnects on SI,PI and EMI.
What is an eye diagram and why is Jitter that important? Which influence do filters and interconnects have on SI, PI and EMI? Presented by Rohde & Schwarz and Würth Elektronik Webinar, How are PI, SI and EMI related Watch this video and learn more about characterizing the AC on DC power rails, eye diagrams, Jitter and the influence of filters and interconnects on SI, PI and EMI.
Analysis of a USB-C cable in frequency and time domain and eye diagram In combination with the time domain option R&S®ZNA-K2 and the extended time domain option R&S®ZNA-K20, the R&S®ZNA VNA offers a variety of signal integrity measurements.
This application note provides an introduction to the DDR memory technology and explains common challenges, related to the specific nature of DDR data, command and control buses.
30-Oct-2020 | AN-No. GFM340
14-Jul-2022
Granite River Labs and Rohde & Schwarz extend partnership to broaden European test lab’s compliance testing capabilitiesHaving recently opened their new state-of-the-art high-speed digital compliance test laboratory in Germany, Granite River Labs (GRL) has now further extended their scope of industry services for a growing European market. By adding the R&S ZNB20 vector network analyzer from Rohde & Schwarz to complement the previously acquired R&S RTP164 high-performance oscilloscope, the GRL test lab is able to offer an even broader range of testing services around established and future high-speed digital technologies like Automotive Ethernet or USB.
26-Mar-2024
embedded world 2024: Rohde & Schwarz presents its cutting-edge test solutions for embedded systemsRohde & Schwarz offers comprehensive test and measurement solutions for embedded design challenges for today’s requirements for efficiency, safety, reliability and interoperability. The highlights will be showcased at the embedded world Exhibition & Conference 2024 in Nuremberg, Germany.
07-Jun-2022
Rohde & Schwarz enhances R&S RTP high-performance oscilloscope for even better signal integrity in real timeRohde & Schwarz has paired the outstanding performance of its established R&S RTP oscilloscope with an enhanced user interface and a larger display. The result is an even more flexible oscilloscope in a compact format with a modern look and feel that continues to deliver high-performance signal integrity in real time.
01-Mar-2023
Embedded world 2023: Rohde & Schwarz showcases its state-of-the-art test solutions for embedded systemsEmbedded systems are at the core of today’s electronic devices, whether in consumer electronics, telecommunications, industrial, medical, automotive or aerospace applications. Flawless operation is crucial, and engineers face complex challenges when designing ever more compact embedded systems which meet today’s demands of efficiency, safety, reliability and interoperability. Rohde & Schwarz addresses these challenges with its wide-ranging test and measurement solutions showcased at the embedded world Exhibition & Conference 2023 in Nuremberg.