9 Changi Business Park Vista
Join us for a full-day seminar dedicated to exploring the latest advancements in Memory Technology, with a particular focus on DDR (Double Data Rate) memory. At this event, we will address the measurement challenges encountered when working with DDR and introduce cutting-edge methodologies to tackle these obstacles. The seminar begins with an introduction to Memory Technology, highlighting the significance of DDR in enhancing data transfer rates and overall system performance. We then dive into the complexities of measuring DDR signals, discussing the impact of high-speed data transfer and signal integrity issues.
To overcome these challenges, we present two powerful measurement methodologies: DDR eye and de-embedding. The DDR eye diagram allows for visualizing signal quality in high-speed data links, facilitating the identification of potential issues and optimization of system performance. Additionally, the de-embedding technique enables precise measurement and characterization of DDR components, eliminating the influence of connectors and interconnects. By the end of the seminar, participants will have a comprehensive understanding of DDR measurement challenges and the advanced methodologies employed to address them.
Register now. Seats are limited.
Registration deadline: 18 August 2023
