Spurious measurements

In order to measure the low levels of spurious emissions, it is often necessary to reduce the resolution bandwidth, which increases the measurement time. The R&S®FSW-K50 spurious measurement option automates spurious searches, which are performed faster than the standard spurious search measurements available in spectrum analyzers. You only need to enter the frequency range and the desired spur detection level. The application calculates the optimum resolution bandwidth (RBW) for measuring at each frequency. The R&S®FSW-K50 spurious search option is significantly faster than conventional spurious search methods for measurements at –120 dBm or below.