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Find newsworthy headlines from Rohde & Schwarz, including technical articles, press releases, NEWS magazine articles, and more.
News Search
Find newsworthy headlines from Rohde & Schwarz, including technical articles, press releases, NEWS magazine articles, and more.
3 Results
19-Jul-2022 | Press Release | Test & measurement
Rohde & Schwarz announces on-wafer device characterization test solutionRohde & Schwarz now offers a test solution for full RF performance characterization of the DUT on-wafer which combines the powerful R&S ZNA vector network analyzer from Rohde & Schwarz with industry-leading engineering probe systems from FormFactor. As a result, semiconductor manufacturers can perform reliable and repeatable on-wafer device characterization in the development phase, during product qualification and in production.
07-Apr-2021 | Press Release | Test & measurement
Rohde & Schwarz introduces new R&S ZNA vector network analyzers with up to 67 GHz frequency rangeThe R&S ZNA high-end vector network analyzer (VNA) now features models with 50 GHz and 67 GHz maximum frequencies. This opens up the VNA’s outstanding RF performance, unique hardware concept and innovative touch operation to new areas of application. Signal integrity measurements as well as A&D and 5G component and module characterization are main applications for the new analyzer models.
07-Jan-2021 | Press Release | Test & measurement
EuMW virtual: Rohde & Schwarz demonstrates reliable microwave test solutions for future-looking applicationsRohde & Schwarz is participating at EuMW virtual with a lavishly designed virtual trade show booth, where visitors can learn about new developments and exchange ideas with experts. The focus is on test systems for RF frontend designs, for radar and satellite systems and for wireless technologies from 5G to the sub-terahertz range. European Microwave Week 2020 was postponed and takes place from January 10 to 15, 2021, as an online event.