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Find the information you need from Rohde & Schwarz. Search for products, technologies, applications, manuals, datasheets, tutorials, FAQs, and more.
Search Rohde-Schwarz.com
Find the information you need from Rohde & Schwarz. Search for products, technologies, applications, manuals, datasheets, tutorials, FAQs, and more.
12 Results
Discover solutions for on-wafer testing, die testing and RF probing. Explore wafer testing equipment, such as vector network analyzers and probe stations.
Discover the perfect solution for RF component testing and microwave component testing. Explore our comprehensive portfolio for RF microwave components. .
19-Jul-2022 | Press Release | Test & measurement
Rohde & Schwarz announces on-wafer device characterization test solutionRohde & Schwarz now offers a test solution for full RF performance characterization of the DUT on-wafer which combines the powerful R&S ZNA vector network analyzer from Rohde & Schwarz with industry-leading engineering probe systems from FormFactor. As a result, semiconductor manufacturers can perform reliable and repeatable on-wafer device characterization in the development phase, during product qualification and in production.
Early wafer-level qualification of RF components ensures quality and saves money
14-Jul-2022
On-wafer characterization at sub-THz frequencies
12-Dec-2023
Stable RF component production test solutions for constant quality. R&S offers leading-edge test solutions from on-wafer to final devices.
This application note describes a technique to perform the noise figure measurement with FSW-K30 on lossy devices like attenuators with high loss in front of the low noise amplifiers.
24-Jun-2020 | AN-No. 1EF110
Learn about different aspects of load pull analysis and testing. Discover a load pull measurement setup from an industry leader in load pull testing. Explore now.
07-Apr-2021 | Press Release | Test & measurement
Rohde & Schwarz introduces new R&S ZNA vector network analyzers with up to 67 GHz frequency rangeThe R&S ZNA high-end vector network analyzer (VNA) now features models with 50 GHz and 67 GHz maximum frequencies. This opens up the VNA’s outstanding RF performance, unique hardware concept and innovative touch operation to new areas of application. Signal integrity measurements as well as A&D and 5G component and module characterization are main applications for the new analyzer models.
Choose Rohde & Schwarz test solutions for passive components for reliable test results and test speed reasons.
07-Jan-2021 | Press Release | Test & measurement
EuMW virtual: Rohde & Schwarz demonstrates reliable microwave test solutions for future-looking applicationsRohde & Schwarz is participating at EuMW virtual with a lavishly designed virtual trade show booth, where visitors can learn about new developments and exchange ideas with experts. The focus is on test systems for RF frontend designs, for radar and satellite systems and for wireless technologies from 5G to the sub-terahertz range. European Microwave Week 2020 was postponed and takes place from January 10 to 15, 2021, as an online event.
. * Bachelor’s or Master’s Degree in Electrical Engineering or equivalent* A minimum of 5 years of experience working with VNAs* Proven RF measurement science knowledge such as s-parameters, noise figure, spurious, TOI, AM-AM, AM-PM, group delay, pulsed envelope analysis, on wafer, antenna test, and signal integrity.* Experience with programming instrumentation * Ability to travel 50% of the time*