High speed digital design testing with Rohde & Schwarz

Electronic Design & Test Day 2019

Watch the videos of all nine expert talks

Rohde & Schwarz was running an Electronic Design & Test Day in Munich on 21st February 2019. Experts of the industry and of Rohde & Schwarz were talking about design challenges, test methods and solutions. Focusing on design and testing of DC/DC converters, ensuring power integrity and high-speed interfaces, the day was concluded with IoT wireless interfaces in electronic design.

Industry guest speakers of EyeKnowHow, Picotest and Texas Instruments were prioritizing the design view including key challenges and methods. Demonstrating the solutions and applications, Rohde & Schwarz presenters were bridging product benefits with the industry design view. Time and frequency domain aspects were discussed and best practices proposed for both.

Keynote speech
Closely connected: power integrity and signal integrity - Steve Sandler, Picotest

Focal point 1: DC/DC converter design and testing

Switch-mode power converter compensation made easy - Bernd Geck, Texas Intsruments
All-in-one test solution for power electronics design - Andreas Ibl, Rohde & Schwarz
EMI precompliance testing - Stefan Stahuber, Rohde & Schwarz

Focal point 2: ensuring power integrity - design and testing

Power integrity for distributed systems - Steve Sandler, Picotest
Measurement tools to verify power integrity and PDN impedance - Martin Stumpf and Andrea D'Aquino, Rohde & Schwarz

Focal point 3: high-speed interface design and testing

Challenges in the verification of a DDR memory interface - Hermann Ruckerbauer, EyeKnowHow
Debugging high-speed designs with high-performance oscilloscopes - Guido Schulze and Anja Paula, Rohde & Schwarz
IoT: wireless interfaces in electronic designs - Joerg Koepp, Rohde & Schwarz

All nine expert talks have been recorded and optimized for presenter and slide view. Watch the videos and benefit from a big picture of design and test with a lot of relevant details on signal integrity, power integrity and EMI compliance.

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Closely connected: power integrity and signal integrity

Keynote speech from Steven Sandler, industry expert and CEO of Picotest

Engineers tend to see power integrity and signal integrity as separate, unrelated disciplines, but in reality they are closely related. The relationship between these disciplines needs to be considered during the design to optimize performance and to avoid expensive design flaws that are difficult to correct. This session highlights some of the mistakes often overlooked.

Power converter design and testing with Rohde & Schwarz

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DC/DC converter design & testing

Bernd Geck, Texas Instruments / Andreas Ibl, Rohde & Schwarz / Stefan Stahuber, Rohde & Schwarz

This focal point covers the design of switch-mode power converters while breaking it down into a step-by-step process that engineers can follow to compensate a power converter. Test solutions and methods addressing the design challenges conclude this theme.

Learn more about DC/DC converter design & testing

Switch-mode power converter compensation made easy

We look into the theory of compensation and why it’s needed, examine various power stages and discuss how to place the poles and zeroes of the compensation network. Typical error amplifiers and transconductance amplifiers and their effects on the control loop will be discussed.

All-in-one test solution for power electronics design

Control loop stability verification, switching analysis and EMI compliance are key topics for DC/DC converter design. We demonstrate oscilloscope functionality and performance addressing a wide range of power electronics measurements.

EMI precompliance testing

EMI precompliance testing during product development saves money and reduces time to market. This session will briefly discuss the path from EMI debugging via precompliance to a full compliance test. We will have a closer look at a tool for efficient EMI precompliance testing.

Ensuring power integrity - design and testing

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Ensuring power integrity - design and testing

Steve Sandler, Picotest / Martin Stumpf, Rohde & Schwarz / Andrea D'Aquino, Rohde & Schwarz

This theme focuses on most modern distributed systems including analog and digital devices and high-power ASICs. Each device has its own noise sensitivity. Optimum system performance requires appropriate measurement and analysis tools in order to negotiate system demands, which are often complex. Low voltages and strict voltage tolerances as well as high currents and low PDN target impedances are common challenges in the design process.

Learn more about ensuring power integrity

Power integrity for distributed systems

This session provides an insight into system-level issues and effective measurement and analysis techniques for achieving optimum system performance with rival requirements.

Measurement tools to verify power integrity and PDN impedance

We will take a look at oscilloscope and network analyzer-based measurement solutions to analyze power rail disturbances in the time and frequency domains and to measure the impedance of the power delivery network (PDN).

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High-speed interface design and testing

Hermann Ruckerbauer, EyeKnowHow / Guido Schulze, Rohde & Schwarz / Anja Paula, Rohde & Schwarz

This focal point covers modern digital designs including high-speed interfaces such as USB, PCIe, and in particular DDR DRAM memory, one of the last remaining parallel interface standards. We discuss key concerns like signal integrity, power integrity, crosstalk from RF signals and EMI and present debugging methods and tools.

Learn more about high speed interface design & testing

Challenges in the verification of a DDR memory interface

DDR DRAM memory is expected to stay parallel for the next generation(s?) of memory. Verification and debugging of the interface is a difficult task. We look at the main design and debugging challenges and discuss best practices.

Debugging high-speed designs with high-performance oscilloscopes and network analyzers

We discuss key test challenges and present methods and tools for debugging digital designs including high-speed interfaces with a data rate of up to 5 Gbps. Measurement methods and solutions for signal integrity of PCB transmission lines, cables and connectors conclude this theme.

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IoT: wireless interfaces in electronic designs

Joerg Koepp, Rohde & Schwarz

Let‘s explore together the landscape of wireless IoT technologies from Bluetooth 5 and Wi-Fi 6 to the fifth generation of mobile networks. Learn about the main challenges of these wireless IoT interfaces as well as their impact on the rest of your design and how multi-domain testing can simplify your IoT journey.

Our solutions

Digital design testing

Choose from our complete test and measurement solutions for signal & power integrity, digital bus and interface standards, stimulation and analysis of analog/digital signals, EMC debugging and Data Converter Design.

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High-speed digital interface testing

High-speed digital interfaces are at the core of all electronic designs. Increasing data rates and growing integration density create new challenges for designs at the IC, board and system level.

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Power electronics

Manage all aspects of power electronics testing with our solutions for embedded power electronics & ICs, electronic installations & lighting and electric drives.

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